BSEM-400 Field Emission Scanning Electron Microscope
Introduction
BSEM-400 is an analytical field emission scanning electron microscope equipped with a high-brightness long-life Schottky field emission electron gun. With the three-stage condenser electron optics column design and the large continuously adjustable beam current, BSEM-400 delivers advantages in EDS, EBSD, WDS, and other analytical applications. The system supports low vacuum mode, which can help directly observe poorly conductive or even non-conductive samples. Standard optical navigation mode, as well as an intuitive user operation interface, makes your analysis work easy.
Details
Overview
Packaging & Delivery
Packaging Details:Strong Carton with Polyfoam Protection
Port:Beijing
Lead Time:Within 2-4 Weeks after Receiving Payment
Introduction
BSEM-400 is an analytical field emission scanning electron microscope equipped with a high-brightness long-life Schottky field emission electron gun. With the three-stage condenser electron optics column design and the large continuously adjustable beam current, BSEM-400 delivers advantages in EDS, EBSD, WDS, and other analytical applications. The system supports low vacuum mode, which can help directly observe poorly conductive or even non-conductive samples. Standard optical navigation mode, as well as an intuitive user operation interface, makes your analysis work easy.
Features
1. High resolution
The resolution is better than 1nm resolution at 30 kV.
2. Three-stage Condenser Lens and continuously adjustable beam current
Three-stage condenser lens design, wide beam current adjustable range.
3. Schottky field emission electron gun
Equipped with high brightness and long life Schottky field emission electron gun.
4. Non-immersion Magnetic Field Free Objective Lens
Non-immersion magnetic field free objective lens design, can directly observe magnetic samples.
5. Standard optical navigation mode
The standard optical navigation mode and software make analysis work easier.
6. Low vacuum mode
High-performance low vacuum secondary electron detectors, observe poorly conductive or non-conductive samples.
7. 1 min fast specimen switch
Easy and fast to switch the specimen.
Application
Specification
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Item |
Specification |
BSEM-400 |
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Electron Optical System |
High Brightness Schottky Field Emission Electron Gun |
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Resolution: 1nm@30kV (SE),0.9nm@30kV (STEM) |
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Magnification: 1-1,000,000x |
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Accelerating voltage: 200V-30kV |
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Detector and Extension |
Everhart-Thornley Detector (ETD) |
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Low Vacuum Detector (LVD) |
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Backscattered Electron Detector (BSE) |
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Vibration Isolation table |
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Trackball & Knob Control Panel |
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Specimen Chamber |
Vacuum system: Fully Automated Control |
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Low vacuum: Max 180 Pa |
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Camera |
Dual Cameras |
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Optical navigation |
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In-chamber monitoring |
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Stage Range: X: 120mm. Y: 115mm. Z: 50mm. R: 360° T: -10°- +90° |
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Software |
Windows. Nav-Cam, Gesture Quick Navigation. Auto Brightness & Contrast, Auto Focus, and Auto Stigmator. |
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Note: ● Standard Outfit, ○ Optional
